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Radiative recombination lifetime of excitons in self-organized
InAs/GaAs quantum dots
A. Mellitia,*, M.A. Maarefa, F. Hassenb, M. Hjirib, H. Maarefb, J. Tignonc, B. Sermaged
aUnite de Recherche de Physique des Semiconducteurs, Institut Preparatoire aux Etudes Scientifiques et Technologiques,
La Marsa 2070, TunisiabLaboratoire de Physique des Semiconducteurs, Faculte des Sciences de Monastir, Monastir, Tunisia
cLaboratoire de Physique de la Matiere Condensee, Ecole Normale Superieure, 24 rue Lhomond, 75231 Paris cedex 05, Paris, FrancedLaboratoire de Photonique et de Nanostructures, CNRS, Route de Nozay, 91460 Marcoussis, France
Received 22 May 2003; accepted 26 August 2003 by T.T.M. Palstra
Abstract
We report an investigation of the exciton dynamics in self-organized InAs/GaAs quantum dots (QD’s) grown by molecular-
beam epitaxy on (001)-oriented GaAs substrate. We have combined continuous wave and time resolved luminescence as a
function of temperature to obtain quantitative information on the recombination processes in the dots. We have found that the
excitonic radiative lifetime of two monolayers InAs QD’s is almost independent of temperature.
q 2003 Elsevier Ltd. All rights reserved.
PACS: 78.67.HC; 81.16.Nd; 78.55.Ap; 81.07.Ta
Keywords: A. InAs/GaAs; A. Quantum dots; D. Decay time; D. Radiative lifetime; E. Photoluminescence; E. Temperature
1. Introduction
The quest for high performance optoelectronic devices
has promoted a growing interest for zero-dimensional
semiconductor quantum dots (QD’s). In these systems,
indeed, the strong localization of the electronic wave
function leads to an atomic-like electronic density of states
and to the possible realization of novel and improved
photonic and electronic devices [1–3]. Furthermore, the
self-aggregation of defect-free QD’s during the epitaxial
deposition of strained semiconductor layers [4] has
stimulated a large number of experimental works. QD
injection-laser prototypes, made from InAs/GaAs hetero-
structures, have now characteristics as good as quantum
well based devices [5]. In order to assess QD for application
in photonic devices parameters such as carrier radiative
lifetime must be measured. A systematic study of this
parameter in quantum boxes formed naturally along the axis
of a V-shaped GaAs/AlGaAs quantum wires by means of
time and spatially resolved resonant photoluminescence
(PL) has been reported by Bellessa et al. [6]. They have
found that the radiative recombination rate varies linearly
with the length of the box. Heitz et al. [7] have investigated
by time resolved PL spectroscopy the recombination in self-
organized InAs/GaAs luminating at about 1.1 eV. They
have found that the radiative lifetime is around 1 ns at
1.8 K. As regards the excited states in self-assembled InAs/
GaAs QD’s Raymond et al. [8] have proposed a model that
allows to calculate the radiative rates at low temperature.
The calculated rates decline from 109 to 1.4 £ 108 s21 as
higher energy states are probed. On the other hand, using PL
spectroscopy and a Monte Carlo model Buckle et al. [9]
have shown that the radiative decay time of the emission
from the ground, first excited, second excited and third
excited states are about 1, 3.7, 4, and 1.4 ns at 6 K. Weaker
values of radiative lifetime have been reported for self-
assembled AlInAs/AlGaAs QD’s (500 ps) [10] and single
CdSe/ZnSe QD (290 ps) [11].
0038-1098/$ - see front matter q 2003 Elsevier Ltd. All rights reserved.
doi:10.1016/j.ssc.2003.08.020
Solid State Communications 128 (2003) 213–217
www.elsevier.com/locate/ssc
* Corresponding author. Tel.: þ216-989-996-46; fax: þ216-717-
465-51.
E-mail address: [email protected] (A. Melliti).
In this paper, we investigate the effect of the temperature
on the excitonic radiative lifetime in self-organized
InAs/GaAs QD’s by time resolved (TR) and continuous
wave (CW) PL. The sizes of these structures are not
uniform. The carriers diffuse from small QD’s to larger ones
[12–19]. This process causes the refilling of large QD’s at
high temperature during the decay. Consequently, the direct
determination of the radiative lifetime of these QD’s is
impossible. To avoid this problem, we have limited the
study of this process to the small QD’s. We have calculated
the radiative lifetime using the rate equation model [12].
The decay constant of the ground state has been modeled
correctly by this model [12,20].
2. Sample growth and experimental details
The InAs QD’s embedded in GaAs were grown on an
(001)-oriented GaAs substrate by using a molecular beam
epitaxy system. An undoped GaAs buffer layer was grown
on the substrate at 580 8C. The self-organized coherent InAs
islands were formed at 520 8C by deposition of nominally
two monolayers grown between two 200 A thick layers of
GaAs. The temperature was then increased to 580 and a
300 A GaAs cap layer was grown. The morphology of the
InAs islands, grown under the same conditions as an
uncapped sample, were investigated in air by contact mode
by atomic force microscopy using a digital Nanoscope III
system. The results show two main size distributions (larger
20 nm diameter and smaller 14 nm diameter QD’s). The
QD’s density was estimated as 3 £ 1010 cm22
The CWPL emission was spectrally resolved by a
monochromator blazed at 1 m. The excitation source was
a frequency-doubled Nd: vanadate laser emitting at 2.33 eV
(into the GaAs barrier) with an excitation power density of
the order of 5 W cm22. The luminescence was detected with
a silicon avalanche photodiode. The sample was held in a
closed cycle He cryostat.
TRPL measurements were made using a closed cycle He
cryostat and mode-locked Ti-saphir laser giving nearly
Fourier-transform limited pulse in the range of 1–1.5 ps
with a repetition rate of 82 MHz. Its energy was tuned to
1.46 eV (into the wetting layer (WL)). The excitation power
density is of the order of 80 W cm22. The emission is
spectrally dispersed using a monochromator. Next, temporal
analysis is performed by a synchro scan streak camera.
Finally, the signal is detected using a charge-coupled
device. The time resolution lies around 5 ps.
3. Results and discussion
Fig. 1 shows a broad CWPL band associated to the
luminescence of QD’s at different temperatures. The PL
band obtained at 10 K is centered around 1.24 eV. The
luminescence results from the radiative recombination on
the ground and excited states of two QD’s size distributions
[16].
Fig. 2 shows the TRPL decays measured at different
Fig. 1. QD’s PL bands at different temperatures.
Fig. 2. Each figure shows PL decay obtained at different
temperatures for a particular emitting state (solid line), (a) and (b)
correspond, respectively, to emitting states of energies 1.128 and
1.299 eV at 10 K. The detection energy is redshifted as the
temperature increases to account for the energy band-gap-shift
with temperature. The dotted lines show fit curves.
A. Melliti et al. / Solid State Communications 128 (2003) 213–217214
temperatures and at detection energies corresponding to the
low and high-energy sides of the QD’s PL spectra. Each
detection energy corresponds to a particular emitting state.
As the temperature varies from 10 K toward higher values,
the detection energies are redshifted to take into account the
energy band-gap-shift with temperature. For the first order
of approximation, the band gap shift is estimated using the
formula described in Ref. [21]. For the low energy detection
ðE1 ¼ 1:179 eVÞ (Fig. 2(a)), the PL decay can be well fitted
by a monoexponential for low temperatures (,90 K) and
high temperatures (.200 K). In the intermediate tempera-
ture range, the PL intensity is initially constant over a few
hundred of picoseconds. This result may be due to two
processes: the refilling of the large QD’s by carriers escaped
from small QD’s and the state blocking caused by the effects
of Pauli exclusion [9]. For the high-energy detection ðE3 ¼
1:318 eVÞ (Fig. 2(b)) we have not observed the PL intensity
saturation vs. time. This behavior indicates that the
recapture by small QD’s is weak. On the other hand, for
the high-energy detection, the PL decay is fitted by two
exponentials. We attribute the two components to the
superposition of excited states PL of large QD’s and ground
states PL of smaller ones.
Fig. 3 shows the PL decay times for various emission
energies plotted vs. sample temperature. The luminescence
decay times were determined by fitting the experimental
decay curves at a particular emission energy to a single
exponential over a time windows selected to avoid the
possible influence of excited state emission. The arrows in
the inset indicate the positions of detection energies within
the QD’s PL band. We remark that the decay time associated
to the high-energy extremity of the PL band ðE3 ¼ 1:318
eVÞ is almost constant (750 ps) up to 100 K. Then it
decreases with temperature. For lower detection energies,
the decay time curves show a maximum. The greater
maximal value is obtained for E1 ( ¼ 1.179 eV). We note
that the maximal decay times and the PL saturation vs. time
(shown in Fig. 2(a)) are obtained in the same temperature
range.
The model developed in Ref. [12] explains the behavior
of decay time corresponding to a given detection energy. At
sufficiently high temperature, the small QD’s experience a
relatively large rate of thermal emission of electron-hole
pairs back into the WL, leading to a reduction of the PL
decay time for these QD’s. Meanwhile, recapture from the
WL causes the repopulation of the other lower-energy QD’s
and leads to an increase of their PL decay time. At higher
temperatures, thermally activated emission ultimately
begins to cause a decrease of the PL decay times of the
lower-energy QD states. This model allows us to interpret
the variation as a function of temperature of the decay time
corresponding to a given energy detection, but it does not
explain its increase as the detection energy vary from E0
( ¼ 1.16 eV at 10 K) to E1 ( ¼ 1.179 eV at 10 K).
We note that the variation of the decay time of QD’s
corresponding to the high-energy extremity of the PL
spectra (HEQD’s), that does not increase at low tempera-
tures, indicates that the recapture has no significant effect on
the evolution of the population of these QD’s.
We have analyzed our results using the rate equation
deduced from the model developed in Ref. [12]:
dn
dt¼ cMJ 2
1
tr
þ1
te
� �n ð1Þ
Where n is the population of QD’s excitons, c is the capture
rate coefficient, M is the number of WL excitons per unit
area, JðEÞ is the normalized density of ground states of QD’s
excitons, it is related to the inhomogeneous broadening of
QD’s PL band, tr and te correspond, respectively, to the
radiative lifetime and to the time for thermal emission to the
WL.
We neglect the recapture of carriers by HEQD’s. This
approximation is supported by the fact that for these QD’s:
† The decay does not present a saturation vs. time (Fig.
2(b))
† The decay time does not increase with temperature (Fig.
3)
† The value of JðEÞ is small.
Using this approximation, the rate equation of excitons
in these QD’s is given in the case of pulsed excitation by:
dn
dt< 2
1
tr
þ1
te
� �n ¼ 2
1
tn ð2Þ
solution of this equation corresponding to RTPL
Fig. 3. PL decay times vs. temperature. Solid lines provide a guide
to the eye. The values of E0 ¼ 1:16 eV; E1 ¼ 1:179 eV; E2 ¼
1:227 eV and E3 ¼ 1:318 eV represent the detection energies at
what the PL is measured at 10 K. As one moves along each line
from 10 K toward higher temperatures, the energy detection is
redshifted to account for the energy-band-gap shift with tempera-
ture. The arrows in the inset indicate the positions of the detection
energies within the PL band obtained at 10 K for pulsed excitation.
A. Melliti et al. / Solid State Communications 128 (2003) 213–217 215
measurements is given by n ¼ n0 expð2t=tÞ: The decay time
corresponding to energy close to E3 can be directly
interpreted as t: For a continuous excitation, n is given
by: n ¼ cJMt: The CWPL intensity (IPL) can be written as:
IPL ¼ cJMt=tr
Considering two detection energies corresponding to
HEQD’s (E01 ¼ 1:31 eV and E0s2 ¼ 1:32 eV) we obtain the
following equations:
IPLðE1Þ
IPLðE2Þ¼
tr2
tr1
t1
t2
JðE01Þ
JðE02Þ
ð3Þ
1
t1
¼1
tr1
þ1
te1
ð4Þ
1
t2
¼1
tr2
þ1
te2
ð5Þ
Where t1 ðt2Þ; tr1 ðtr2Þ and te1 ðte2Þ are, respectively, the
decay time, the radiative lifetime and the thermal emission
time corresponding to E01 ðE
02Þ: te1 and te2 are related by the
relationship [12]:
te1 ¼ te2 expE0
2 2 E01
2kbT
� �ð6Þ
To estimate J we have used the CWPL band obtained with
excitation power of 0.5 W cm22 and at 10 K, to avoid the
excited states contribution and the influence of inter-dots
diffusion. The Eqs. (3)–(6) allow to calculate the radiative
lifetime from the CWPL and RTPL measurements. The
values of tr are presented in Fig. 4. We note that tr is of the
order of 800 ps and is almost independent of temperature.
The calculated value of tr is smaller than that measured
by Heitz et al. [7] and Buckle et al. [9] (1 ns). The QD’s
studied by Heitz and Buckle are larger than those studied
here. Indeed, the transition energy of QD’s studied by Heitz
and Buckle are 1.1 and 1.13 eV, respectively, and those of
QD’s studied here are 1.31 and 1.32 eV. The decrease of the
radiative lifetime with decreasing QD size is connected with
a reduction of confinement effects [20].
The flat temperature dependence of the exciton radiative
lifetime is expected [13,22]. Indeed, the density of states
consists of a series of d functions. Increasing, the
temperature cannot redistribute excitons within a band of
adjacent states since these do not exist.
4. Conclusion
We have determined the radiative lifetime of small QD’s
(diameter ¼ 140 A) using CWPL and TRPL measurements.
We have found that the excitonic radiative lifetime is of the
order of 800 ps and is almost independent of temperature.
On the other hand, we have observed that for intermediate
temperature range, the PL intensity of large QD’s remains
constant over a few hundred of picoseconds. We have
attributed this behavior to two processes: the refilling of the
large QD’s by carriers escaped from small QD’s and the
state blocking caused by the effects of Pauli exclusion.
References
[1] G. Bryant, Phys. Rev. B 37 (1988) 8763.
[2] S. Schmitt-Rink, D. Miller, D. Chemla, Phys. Rev. B 35
(1987) 8113.
[3] T. Takagahara, Phys. Rev. B 36 (1987) 9293.
[4] D. Leonard, K. Pond, P.M. Petroff, Phys. Rev. B 50 (1994)
11687.
[5] D. Bimberg, M. Grundmann, N. Ledentsov, MRS Bull. 23
(1998) 31.
[6] J. Bellessa, V. Voliotis, R. Grousson, X.L. Wang, M. Ogura,
H. Hatsuhata, Phys. Rev. B 58 (1998) 9933.
[7] R. Heitz, M. Veit, N.N. Ledentsov, A. Hoffmann, D. Bimberg,
V.M. Ustinov, P.S. Kop’ev, Zh.I. Alferov, Phys. Rev. B 56
(1997) 10435.
[8] S. Raymond, X. Guo, J.L. Merz, S. Fafard, Phys. Rev. B 59
(1999) 7624.
[9] P.D. Buckle, P. Dawson, S.A. Hall, X. Chen, M.J. Steer, D.J.
Mowbray, M.S. Skolnick, M. Hopkinson, J. Appl. Phys. 86
(1999) 2555.
[10] S. Raymond, S. Fafard, S. Charbonneau, R. Leon, D. Leonard,
P.M. Petroff, J.L. Merz, Phys. Rev. B 52 (1995) 17238.
[11] G. Bacher, R. Weigand, J. Seufert, V.D. Kulakovskii, N.A.
Gippius, A. Forchel, K. Leonardi, D. Hommel, Phys. Rev.
Lett. 83 (1999) 4417.
[12] W. Yang, R.R. Lowe-Webb, H. Lee, P.C. Sercel, Phys. Rev. B
56 (1997) 13314.
[13] H. Yu, S. Lycett, C. Roberts, R. Murray, Appl. Phys. Lett. 69
(1996) 4087.
[14] A. Fiore, P. Borri, W. Langbein, J.M. Hvam, U. Oesterle, R.
Houdre, R.P. Stanley, M. Llegems, Appl. Phys. Lett. 76 (2000)
3430.
[15] M. Hjiri, F. Hassen, H. Maaref, Mater. Sci. Engng B 69–70
(2000) 514.
Fig. 4. Radiative recombination time (tr1 and tr2) corresponding to
E01 ¼ 1:31 eV (circles) and E0
2 ¼ 1:32 eV (squares).
A. Melliti et al. / Solid State Communications 128 (2003) 213–217216
[16] M. Hjiri, F. Hassen, H. Maaref, Mater. Sci. Engng B 88 (2002)
255.
[17] M. Hjiri, F. Hassen, H. Maaref, Mater. Sci. Engng B 74 (2000)
253.
[18] S. Sanguinetti, M. Henini, M.G. Alessi, M. Capizzi, P. Frigeri,
S. Franchi, Phys. Rev. B 60 (1999) 8276.
[19] L. Brusaferri, S. Sanguinetti, E. Grilli, M. Guzzi, A. Bignazzi,
F. Bogani, L. Carraresi, M. Colocci, A. Bosacchi, P. Frigeri, S.
Franchi, Appl. Phys. Lett. 69 (1996) 3354.
[20] D. Bimberg, M. Grundmann, N.N. Ledentsov, Quantum dot
Heterostructures, Wiley, Chichester, 1999, p. 251.
[21] S. Adachi, Physical Properties of III–V Semiconductor
Compounds, Wiley, New York, 1992, p. 104.
[22] G. Wang, S. Fafard, D. Leonard, J.E. Bowers, J.L. Merz, P.M.
Petroff, Appl. Phys. Lett. 64 (1994) 2815.
A. Melliti et al. / Solid State Communications 128 (2003) 213–217 217